原始名称记载: Rohde & Schwarz GmbH & Co. KG

The present disclosure relates to a test fixture for being connected to a calibration device for calibrating a test and/or measurement instrument. The test fixture includes a probing point configured to receive a calibration signal while being in contact with a probe. The test fixture has a memory configured to store fixture data related to the probing point. Further, a calibration setup and a method of calibrating a test and/or measurement instrument are described.

A digital signal processing (DSP) circuit is described. The DSP circuit includes a signal input, a signal encoding circuit, a generative circuit, and a DSP function circuit. The signal input is configured to receive at least one input signal. The signal encoding circuit is configured to process the at least one input signal, wherein the signal encoding circuit is configured to map the at least one input signal to at least one signal characterization parameter. The generative circuit is configured to generate a set of measurement data based on the at least one signal characterization parameter, wherein the set of measurement data includes at least one measurement value. The DSP function circuit is configured to provide a DSP functionality. The DSP function circuit is configured to process and/or combine the set of measurement data, thereby obtaining a set of expedited output data.