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DETECTION SUBSTRATE, X-RAY IMAGING SYSTEM, AND IMAGE CORRECTION METHOD AND APPARATUS

发明专利审中
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14权利要求 · 1 独立
§ Ⅰ

卷宗概要

发明人

Chuncheng CHE; Shuai XU; Xin LI; Xuecheng HOU; Guan ZHANG; Zhenqian ZHAO; Chao CHEN

IPC 分类

A61B 6/42A61B 6/G6T 5/50

CPC 分类

A61B6/4233A61B6/5258A61B6/542G6T5/50G6T2207/10116G6T2207/20224

The detection substrate comprises an automatic exposure detection unit, a control unit, a gate driving unit, and a data reading unit, wherein the automatic exposure detection unit is configured to send a first notification signal to the control unit when detecting that exposure is started; the control unit is configured to output, in a scanning time period, a first signal and a second signal to the gate driving unit, output the first signal to the end of the current frame when the first notification signal is received; the gate driving unit is configured to control the starting sequence of a plurality of detection units according to the first signal and the second signal in the scanning time period; and the data reading unit is configured to read data of a data line according to a data reading signal in the scanning time period.

原文(中文)

The detection substrate comprises an automatic exposure detection unit, a control unit, a gate driving unit, and a data reading unit, wherein the automatic exposure detection unit is configured to send a first notification signal to the control unit when detecting that exposure is started; the control unit is configured to output, in a scanning time period, a first signal and a second signal to the gate driving unit, output the first signal to the end of the current frame when the first notification signal is received; the gate driving unit is configured to control the starting sequence of a plurality of detection units according to the first signal and the second signal in the scanning time period; and the data reading unit is configured to read data of a data line according to a data reading signal in the scanning time period.