Method and Control Unit For Monitoring The Temperature Of An Electronic Device
卷宗概要
发明人
Markus Stutika; Jorge Felix Silva Gracia; Fabian Klein; Alex Schmidt
IPC 分类
CPC 分类
A method for monitoring the temperature of an electronic device is provided. The method includes specifying a position for temperature monitoring in a region of the electronic device and determining a parameter value of a parameter that is associated with an actual temperature at the position. The method also includes calculating a temperature at the position based on the parameter value using a calibrated model, where the calibrated model is implemented in a control unit and calibrated in such a way that the sum of the actual temperature at the position and a specified tolerance threshold is less than or equal to the calculated temperature. A corresponding control unit is also provided.
原文（中文）
A method for monitoring the temperature of an electronic device is provided. The method includes specifying a position for temperature monitoring in a region of the electronic device and determining a parameter value of a parameter that is associated with an actual temperature at the position. The method also includes calculating a temperature at the position based on the parameter value using a calibrated model, where the calibrated model is implemented in a control unit and calibrated in such a way that the sum of the actual temperature at the position and a specified tolerance threshold is less than or equal to the calculated temperature. A corresponding control unit is also provided.