SYSTEM FOR WINDSHIELD RESIDUE DETECTION AND QUANTIFICATION
卷宗概要
发明人
Jiasen ZHENG; Karthik PADUCHURU SUBRAMANYAM; Brian HETTIARACHCHI; Lily MA
IPC 分类
CPC 分类
Some embodiments of the present disclosure relate to systems and methods for detecting and quantifying residues on a surface, such as a windshield, for a vehicle. In some embodiments, a system may include a light source assembly, a camera assembly, and a computing device. The light source assembly can direct a polarized light toward the surface. The camera assembly can capture the polarized light reflected from the surface to generate an image. The computing device can process the image to generate a processing result indicative of cleanliness of the surface.
原文(中文)
Some embodiments of the present disclosure relate to systems and methods for detecting and quantifying residues on a surface, such as a windshield, for a vehicle. In some embodiments, a system may include a light source assembly, a camera assembly, and a computing device. The light source assembly can direct a polarized light toward the surface. The camera assembly can capture the polarized light reflected from the surface to generate an image. The computing device can process the image to generate a processing result indicative of cleanliness of the surface.