CNIPA.AI
返回搜索
档案

SYSTEM FOR WINDSHIELD RESIDUE DETECTION AND QUANTIFICATION

发明专利审中
2浏览
20权利要求 · 2 独立
§ Ⅰ

卷宗概要

发明人

Jiasen ZHENG; Karthik PADUCHURU SUBRAMANYAM; Brian HETTIARACHCHI; Lily MA

IPC 分类

G1N 21/88G1N 21/958

CPC 分类

G1N21/8851G1N21/8806G1N21/958G1N2021/8848G1N2021/889G1N2021/9586

Some embodiments of the present disclosure relate to systems and methods for detecting and quantifying residues on a surface, such as a windshield, for a vehicle. In some embodiments, a system may include a light source assembly, a camera assembly, and a computing device. The light source assembly can direct a polarized light toward the surface. The camera assembly can capture the polarized light reflected from the surface to generate an image. The computing device can process the image to generate a processing result indicative of cleanliness of the surface.

原文(中文)

Some embodiments of the present disclosure relate to systems and methods for detecting and quantifying residues on a surface, such as a windshield, for a vehicle. In some embodiments, a system may include a light source assembly, a camera assembly, and a computing device. The light source assembly can direct a polarized light toward the surface. The camera assembly can capture the polarized light reflected from the surface to generate an image. The computing device can process the image to generate a processing result indicative of cleanliness of the surface.