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QANTITATIVE DETECTION METHOD OF MICRO-DEFECTS THROUGH LOW-FREQUENCY ULTRASONIC MULTI-RESOLUTION SCANNING IMAGING

发明专利审中
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§ Ⅰ

卷宗概要

发明人

Zhiyuan MA; Li LIN

IPC 分类

G1N 29/6G1N 29/44G1N 29/46

CPC 分类

G1N29/654G1N29/4454G1N29/449G1N29/46G1N2291/289

In a quantitative detection method of micro-defects through low-frequency ultrasonic multi-resolution scanning imaging, the collected ultrasonic A-type scanning signals are decomposed through split spectrum processing into sub-signals with different center frequencies f, amplitude imaging is performed on the same sub-signals f, a defect size ddetected by a half of the amplitude of the image is identified, linear fitting is performed on dwith faccording to the sound field directivity function, and dcorresponding to the slope k=−0.01 of the fitting curve is the quantitative size of the defect.

原文(中文)

In a quantitative detection method of micro-defects through low-frequency ultrasonic multi-resolution scanning imaging, the collected ultrasonic A-type scanning signals are decomposed through split spectrum processing into sub-signals with different center frequencies f, amplitude imaging is performed on the same sub-signals f, a defect size ddetected by a half of the amplitude of the image is identified, linear fitting is performed on dwith faccording to the sound field directivity function, and dcorresponding to the slope k=−0.01 of the fitting curve is the quantitative size of the defect.