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OPTOELECTRONIC SENSOR FOR A TIME-OF-FLIGHT MEASUREMENT AND METHOD FOR A TIME-OF-FLIGHT MEASUREMENT

发明专利审中
16权利要求 · 2 独立
§ Ⅰ

卷宗概要

发明人

Loic PERRUCHOUD; Pierre-Yves TALOUD; Bastien MOYSSET; Pablo TRUJILLO SERRANO; Scott LINDNER

IPC 分类

G1S 7/4863G1S 7/481G1S 7/4865G1S 7/497G1S 17/10

CPC 分类

G1S7/4863G1S7/4815G1S7/4816G1S7/4865G1S7/497G1S17/10

An optoelectronic sensor for a time-of-flight (ToF) measurement includes a light projector, a light receiver, a receiver logic, and a processing unit. The light receiver includes a number of macro-pixels. The receiver logic is operable to generate light ToF data for the respective macro-pixels corresponding to a number of time windows. The processing unit selects an initial set of integration times that defines an integration time for each time window and macro-pixel and acquires an initial frame of ToF data by collecting ToF generated from the macro-pixels according to the time windows and integration times defined in the initial set of integration times. The processing unit also computes a metric from the initial frame of ToF data. The metric is indicative of a data quality generated by the respective macro-pixels.

原文(中文)

An optoelectronic sensor for a time-of-flight (ToF) measurement includes a light projector, a light receiver, a receiver logic, and a processing unit. The light receiver includes a number of macro-pixels. The receiver logic is operable to generate light ToF data for the respective macro-pixels corresponding to a number of time windows. The processing unit selects an initial set of integration times that defines an integration time for each time window and macro-pixel and acquires an initial frame of ToF data by collecting ToF generated from the macro-pixels according to the time windows and integration times defined in the initial set of integration times. The processing unit also computes a metric from the initial frame of ToF data. The metric is indicative of a data quality generated by the respective macro-pixels.