OPTOELECTRONIC SENSOR FOR A TIME-OF-FLIGHT MEASUREMENT AND METHOD FOR A TIME-OF-FLIGHT MEASUREMENT
卷宗概要
申请人
ams-OSRAM AG; ams-OSRAM Asia Pacific Pte. Ltd.
发明人
Loic PERRUCHOUD; Pierre-Yves TALOUD; Bastien MOYSSET; Pablo TRUJILLO SERRANO; Scott LINDNER
IPC 分类
CPC 分类
An optoelectronic sensor for a time-of-flight (ToF) measurement includes a light projector, a light receiver, a receiver logic, and a processing unit. The light receiver includes a number of macro-pixels. The receiver logic is operable to generate light ToF data for the respective macro-pixels corresponding to a number of time windows. The processing unit selects an initial set of integration times that defines an integration time for each time window and macro-pixel and acquires an initial frame of ToF data by collecting ToF generated from the macro-pixels according to the time windows and integration times defined in the initial set of integration times. The processing unit also computes a metric from the initial frame of ToF data. The metric is indicative of a data quality generated by the respective macro-pixels.
原文(中文)
An optoelectronic sensor for a time-of-flight (ToF) measurement includes a light projector, a light receiver, a receiver logic, and a processing unit. The light receiver includes a number of macro-pixels. The receiver logic is operable to generate light ToF data for the respective macro-pixels corresponding to a number of time windows. The processing unit selects an initial set of integration times that defines an integration time for each time window and macro-pixel and acquires an initial frame of ToF data by collecting ToF generated from the macro-pixels according to the time windows and integration times defined in the initial set of integration times. The processing unit also computes a metric from the initial frame of ToF data. The metric is indicative of a data quality generated by the respective macro-pixels.