NORMALIZATION OF DETECTING AND REPORTING FAILURES FOR A MEMORY DEVICE
卷宗概要
发明人
Randall J. Rooney; Gregg D. Wolff
IPC 分类
CPC 分类
Methods, systems, and apparatuses related to detecting and reporting failures for a memory device are described. When a count of bit-flip errors is above a fail threshold, a memory device can report a failure. Failure reports can indicate a rate at which the memory device is accumulating errors. An offset fail threshold may be applied instead of a default fail threshold, such as a standardized or specified threshold. The offset fail threshold can be a summation of the default fail threshold and an offset determined from an initial error count determined before the memory device has accumulated errors from use.
原文（中文）
Methods, systems, and apparatuses related to detecting and reporting failures for a memory device are described. When a count of bit-flip errors is above a fail threshold, a memory device can report a failure. Failure reports can indicate a rate at which the memory device is accumulating errors. An offset fail threshold may be applied instead of a default fail threshold, such as a standardized or specified threshold. The offset fail threshold can be a summation of the default fail threshold and an offset determined from an initial error count determined before the memory device has accumulated errors from use.