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Semiconductor Device and Method of Forming Interconnect Structure in HBM Module Using VFM

发明专利审中
25权利要求 · 4 独立
§ Ⅰ

卷宗概要

发明人

Minsung Lee; YeoJun Yun; HeeSoo Lee

IPC 分类

H1L 23/H1L 21/56H1L 23/31H1L 23/538H1L 25/65

CPC 分类

H1L24/81H1L24/16H1L24/17H1L25/652H1L21/561H1L23/3107H1L23/538H1L2224/16146H1L2224/16221H1L2224/17181H1L2224/81024H1L2224/81097H1L2224/8122

A semiconductor device has a first electrical component and a second electrical component. A hybrid flux material is deposited over the first electrical component and/or second electrical component. The hybrid flux material can be a flux material with a non-conductive film or non-conductive paste. The second electrical component is stacked over the first electrical component. The first electrical component can be a semiconductor wafer or semiconductor die, and the second electrical component can be a semiconductor wafer or semiconductor die. An interconnect structure is formed between the first electrical component and second electrical component using a VFM signal. Heat can be applied during or after the VFM signal. The interconnect structure can be a bump. An encapsulant is deposited over the first electrical component and second electrical component. The encapsulated and stacked electrical components can be mounted to an interconnect substrate as a HBM module.

原文(中文)

A semiconductor device has a first electrical component and a second electrical component. A hybrid flux material is deposited over the first electrical component and/or second electrical component. The hybrid flux material can be a flux material with a non-conductive film or non-conductive paste. The second electrical component is stacked over the first electrical component. The first electrical component can be a semiconductor wafer or semiconductor die, and the second electrical component can be a semiconductor wafer or semiconductor die. An interconnect structure is formed between the first electrical component and second electrical component using a VFM signal. Heat can be applied during or after the VFM signal. The interconnect structure can be a bump. An encapsulant is deposited over the first electrical component and second electrical component. The encapsulated and stacked electrical components can be mounted to an interconnect substrate as a HBM module.