DYNAMIC METRICS COLLECTION BASED ON SERVER LOAD
卷宗概要
发明人
Ankur Nigam; Mark Anthony Lemoine; Narasimha Rao Gogineni
IPC 分类
CPC 分类
Technology disclosed herein includes systems and methods for collecting server metrics. More specifically, systems and methods for performing dynamic metric collection are disclosed in which the metrics collected are throttled based on server load. In an embodiment of the technology, an agent on a server identifies a metric to collect and determines if the current processing load on the server is above a threshold for the metric. If the processing load is below the threshold, the agent collects the metric. If the processing load is above the threshold, the agent does not collect the metric. Load thresholds may differ between metrics based on how critical the metric is defined to be.
原文（中文）
Technology disclosed herein includes systems and methods for collecting server metrics. More specifically, systems and methods for performing dynamic metric collection are disclosed in which the metrics collected are throttled based on server load. In an embodiment of the technology, an agent on a server identifies a metric to collect and determines if the current processing load on the server is above a threshold for the metric. If the processing load is below the threshold, the agent collects the metric. If the processing load is above the threshold, the agent does not collect the metric. Load thresholds may differ between metrics based on how critical the metric is defined to be.