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TRANSISTOR STRUCTURE WITH MULTIPLE VERTICAL THIN BODIES

发明专利审中
20权利要求 · 3 独立
§ Ⅰ

卷宗概要

发明人

Chao-Chun Lu

IPC 分类

H10D 62/10H10D 30/1H10D 30/60H10D 30/62H10D 64/27

CPC 分类

H10D62/102H10D30/608H10D30/6211H10D62/115H10D64/513H10D64/516H10D64/518H10D30/24

A transistor structure includes a first semiconductor body, a second semiconductor body and a trench isolation (STI) region. The first semiconductor body has a first convex structure, wherein the first convex structure includes at least 3 first upward extended conductor-oxide-semiconductor interfaces. The at least 3 first upward extended conductor-oxide-semiconductor interfaces are horizontally shifted with each other. The second semiconductor body has a second convex structure, wherein the second convex structure includes at least 3 second upward extended conductor-oxide-semiconductor interfaces, wherein the at least 3 second upward extended conductor-oxide-semiconductor interfaces are horizontally shifted with each other. The trench isolation (STI) region is between the first semiconductor body and the second semiconductor body.

原文(中文)

A transistor structure includes a first semiconductor body, a second semiconductor body and a trench isolation (STI) region. The first semiconductor body has a first convex structure, wherein the first convex structure includes at least 3 first upward extended conductor-oxide-semiconductor interfaces. The at least 3 first upward extended conductor-oxide-semiconductor interfaces are horizontally shifted with each other. The second semiconductor body has a second convex structure, wherein the second convex structure includes at least 3 second upward extended conductor-oxide-semiconductor interfaces, wherein the at least 3 second upward extended conductor-oxide-semiconductor interfaces are horizontally shifted with each other. The trench isolation (STI) region is between the first semiconductor body and the second semiconductor body.