SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES
卷宗概要
申请人
SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
发明人
Jimmy Robert Hannes FRANCHI; Martin DOMEIJ
IPC 分类
CPC 分类
A method of making a semiconductor device includes providing semiconductor region of a first conductivity type. A first region comprising the first conductivity type and a second dopant concentration greater than the first dopant concentration is provided within the region. The first region provides a JFET channel region for a JFET device. A second region comprising a second conductivity type is provided within the first region. The second region provides a body region for a MOSFET device and a gate region for the JFET device. The second region comprises a first portion and a second portion below the first portion. The second portion has a higher peak dopant concentration than the first portion. A third region comprising the first conductivity type is provided within and self-aligned to the second region. The third region provides a JFET source for the JFET device.
原文(中文)
A method of making a semiconductor device includes providing semiconductor region of a first conductivity type. A first region comprising the first conductivity type and a second dopant concentration greater than the first dopant concentration is provided within the region. The first region provides a JFET channel region for a JFET device. A second region comprising a second conductivity type is provided within the first region. The second region provides a body region for a MOSFET device and a gate region for the JFET device. The second region comprises a first portion and a second portion below the first portion. The second portion has a higher peak dopant concentration than the first portion. A third region comprising the first conductivity type is provided within and self-aligned to the second region. The third region provides a JFET source for the JFET device.