原始名称记载: Carl Zeiss X-Ray Microscopy, Inc. | CNIPA.AI

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5 条已索引专利记录

№ EP4673729A1发明专利

GRAPHIC OVERLAY FOR SAMPLE CAMERA IN X-RAY MICROSCOPE

GRAPHIC OVERLAY FOR SAMPLE CAMERA IN X-RAY MICROSCOPE

❖Carl Zeiss X-Ray Microscopy, Inc.CHANG, Hauyee; KOTWAL, Naomi; TAN, MeowJan 6, 2026G01N12

№ EP4673730A1发明专利

USER-DRIVEN-THREE-DIMENSIONAL COLLISION AVOIDANCE IN MICROSCOPY SYSTEM

USER-DRIVEN-THREE-DIMENSIONAL COLLISION AVOIDANCE IN MICROSCOPY SYSTEM

❖Carl Zeiss X-Ray Microscopy, Inc.CHANG, Hauyee; KOTWAL, Naomi; CANDELL, Susan; KUHLMAN, Erich; CHU, Andrew; WANG, Li; EVANS, EdwinJan 6, 2026G01N8

№ EP4673731A1发明专利

METHOD AND SYSTEM FOR GUIDED PARAMETER SELECTION IN X-RAY MICROSCOPE

METHOD AND SYSTEM FOR GUIDED PARAMETER SELECTION IN X-RAY MICROSCOPE

❖Carl Zeiss X-Ray Microscopy, Inc.CHANG, Hauyee; KOTWAL, Naomi; HANLON, Justin; TAN, Meow; WHITE, Robin; SMYTH, Brian; KRAMPERT, Gerhard; DUTSCHKE, AnkeJan 6, 2026G01N, G06F10

№ EP4673732A1发明专利

GUIDANCE FOR GEOMETRICAL AND OPTICAL MAGNIFICATION IN X-RAY MICROSCOPE

GUIDANCE FOR GEOMETRICAL AND OPTICAL MAGNIFICATION IN X-RAY MICROSCOPE

❖Carl Zeiss X-Ray Microscopy, Inc.CANDELL, Susan; KOTWAL, Naomi; CHANG, Hauyee; KUHLMAN, Erich; KELLY, Stephen; DUTSCHKE, AnkeJan 6, 2026G01N, G06F9

№ EP4673958A1发明专利

METHOD AND SYSTEM FOR GUIDANCE FOR GEOMETRICAL AND OPTICAL MAGNIFICATION IN X-RAY MICROSCOPE

METHOD AND SYSTEM FOR GUIDANCE FOR GEOMETRICAL AND OPTICAL MAGNIFICATION IN X-RAY MICROSCOPE

❖Carl Zeiss X-Ray Microscopy, Inc.CHU, Andrew; KOTWAL, Naomi; CHANG, Hauyee; CANDELL, Susan; CASE, Thomas A.; SMYTH, Brian; HANLON, Justin; BRODERICK, WayneJan 6, 2026G21K9