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档案
SYSTEM AND METHOD FOR MEASURING SURFACE FEATURES ON SKIN
发明专利审中
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§ Ⅰ
卷宗概要
发明人
AMAVASAI, Balasundram, Periasamy; COWLEY, Kevin, David; BELLAMY, Philip
申请日
Feb 29, 2024
公开日
Jan 6, 2026
IPC 分类
G06T
CPC 分类
G06TG06T2207/30088G06T2207/10012G06T2207/10048G06T2207/10056G06T2207/10148