档案

STRUCTURE FOR DETECTING TEMPERATURE OF ELECTRONIC DEVICE

发明专利审中

§ Ⅰ

卷宗概要

申请人

Samsung Electronics Co., Ltd.

发明人

JU, Wanjae; NA, Hyoseok; PARK, Chanho

申请日

Jul 17, 2018

公开日

Jan 6, 2026

IPC 分类

G01KG01KG01KG06FG06FH05KH05KH05KH04MH01MH01M

CPC 分类

G01KG06FG01KG01KG06FG06FH01M2220/30H01MH01MH05KH05K2201/10151H05KY02EH05KH05K2201/042H05K2201/10128H05K2201/10265H05K2201/0311

外部资源