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HOMOEPITAXIAL THIN FILM, MANUFACTURING METHOD AND MANUFACTURING APPARATUS THEREOF

发明专利审中
20权利要求 · 5 独立
§ Ⅰ

卷宗概要

申请人

Shincron Co., Ltd.

发明人

Yosuke INASE; Suguru SAITO; Mitsuhito ENDO; Toshiya MIYAZAKI

IPC 分类

C30B 23/8C23C 14/50C30B 29/30

CPC 分类

C30B23/8C23C14/50C30B29/30

In order to form a homoepitaxial thin film on the surface of a substrate having LiNbOsingle crystal or LiTaOsingle crystal surface, a composition identical to that of the single crystal is formed by a high-frequency sputtering method on the surface of the substrate having LiNbOsingle crystal or LiTaOsingle crystal surface. Manufacturing apparatus for a homoepitaxial thin film includes a chamber and a high-frequency power source that supplies high-frequency power to a target disposed inside the chamber. Sputtering electrode is arranged such that a surface normal of the target is offset with respect to the substrate located at a film formation position, and is also arranged such that the surface normal of the target is inclined at an angle of 15° to 75° with respect to a surface normal of the substrate.

原文(中文)

In order to form a homoepitaxial thin film on the surface of a substrate having LiNbOsingle crystal or LiTaOsingle crystal surface, a composition identical to that of the single crystal is formed by a high-frequency sputtering method on the surface of the substrate having LiNbOsingle crystal or LiTaOsingle crystal surface. Manufacturing apparatus for a homoepitaxial thin film includes a chamber and a high-frequency power source that supplies high-frequency power to a target disposed inside the chamber. Sputtering electrode is arranged such that a surface normal of the target is offset with respect to the substrate located at a film formation position, and is also arranged such that the surface normal of the target is inclined at an angle of 15° to 75° with respect to a surface normal of the substrate.