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MEASURING INSTRUMENT WITH ARC MOTION AND CORRECTION PROCESS

发明专利审中
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20权利要求 · 3 独立
§ Ⅰ

卷宗概要

IPC 分类

G1B 3/22G1B 3/G1B 21/4

CPC 分类

G1B3/22G1B3/4G1B21/45G1B21/47

A measuring instrument includes a movable portion configured to rotate in an arc motion about a pivot portion, and an electronic position encoder configured to measure an absolute relative position between a detector portion and a scale portion, one of which forms part of the movable portion. A maximum movement range of the movable encoder portion and a maximum absolute measurement range are each less than 360 degrees. Based at least in part on detector signals that are received from the detector portion, an offset value is determined that corresponds to a radial offset (e.g., of the scale portion or the detector portion). The determined offset value is utilized to correct one or more values that are utilized to determine a relative position between the detector portion and the scale portion (e.g., such as a value corresponding to a spatial step or other spatial value of the scale portion).

原文(中文)

A measuring instrument includes a movable portion configured to rotate in an arc motion about a pivot portion, and an electronic position encoder configured to measure an absolute relative position between a detector portion and a scale portion, one of which forms part of the movable portion. A maximum movement range of the movable encoder portion and a maximum absolute measurement range are each less than 360 degrees. Based at least in part on detector signals that are received from the detector portion, an offset value is determined that corresponds to a radial offset (e.g., of the scale portion or the detector portion). The determined offset value is utilized to correct one or more values that are utilized to determine a relative position between the detector portion and the scale portion (e.g., such as a value corresponding to a spatial step or other spatial value of the scale portion).