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METHOD FOR PREPARING SUPPORTING SPRING MODEL AND INTEGRATED INTERFEROMETER DEVICE

发明专利审中
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20权利要求 · 1 独立
§ Ⅰ

卷宗概要

申请人

Harbin Institute of Technology, Shenzhen (Shenzhen Institute of Science and Technology Innovation, H

发明人

Gaopeng XUE; Honglin QIAN; Bing LI

IPC 分类

G1J 3/2G1J 3/26

CPC 分类

G1J3/259G1J3/202G1J3/21G1J3/26

A method for preparing a supporting spring model and an integrated interferometer device are provided, which relates to the technical field of infrared spectrometers. The method includes the following steps: multiple groups of initial control point coordinate sequences, which are determined based on a second-order Bezier curve and are configured to simulate control point coordinates of a supporting spring model, are iterated by using a genetic algorithm; and a supporting spring model for preparing a supporting spring structure in an integrated interferometer device is determined. The supporting spring model are simulated and iterated, so as to improve an optical path difference of the integrated interferometer device and further improve a resolution of the infrared spectrometer. The interferometer device includes a component layer, a buried oxide layer and a substrate layer. Reflectors are integrated with the substrate layer without installing the reflectors additionally.

原文(中文)

A method for preparing a supporting spring model and an integrated interferometer device are provided, which relates to the technical field of infrared spectrometers. The method includes the following steps: multiple groups of initial control point coordinate sequences, which are determined based on a second-order Bezier curve and are configured to simulate control point coordinates of a supporting spring model, are iterated by using a genetic algorithm; and a supporting spring model for preparing a supporting spring structure in an integrated interferometer device is determined. The supporting spring model are simulated and iterated, so as to improve an optical path difference of the integrated interferometer device and further improve a resolution of the infrared spectrometer. The interferometer device includes a component layer, a buried oxide layer and a substrate layer. Reflectors are integrated with the substrate layer without installing the reflectors additionally.