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METHOD AND APPARATUS FOR HIGH PERFORMANCE WIDE FIELD PHOTOTHERMAL IMAGING AND SPECTROSCOPY
发明专利审中
7浏览
25权利要求 · 8 独立
§ Ⅰ
卷宗概要
发明人
Craig Prater; Derek Decker; David Grigg
IPC 分类
G1J 3/10G1J 3/2G1J 3/28G1J 3/447G1J 3/453
CPC 分类
G1J3/108G1J3/208G1J3/224G1J3/2823G1J3/447G1J3/453
A system for infrared analysis over a wide field area of a sample is disclosed herein that relies on interference of non-diffractively separated beams of light containing image data corresponding to the sample, as well as a photothermal effect on the sample.
原文（中文）
A system for infrared analysis over a wide field area of a sample is disclosed herein that relies on interference of non-diffractively separated beams of light containing image data corresponding to the sample, as well as a photothermal effect on the sample.