OPTICAL WINDOW INSPECTION APPARATUS AND LASER RADAR APPARATUS
卷宗概要
发明人
Eiichi SUEYOSHI
IPC 分类
CPC 分类
An optical window inspection apparatus including: a first light projector that emits first detection light that passes through an optical window transmitting incident light; a second light projector that emits second detection light that does not pass through the optical window; a light receiver that receives the first detection light and the second detection light in which a first voltage corresponding to an intensity of the received first detection light and a second voltage corresponding to an intensity of the received second detection light are generated; and a control unit that corrects a value of the first voltage based on a value of the second voltage and a predetermined reference value and performs processing to detect contamination of the optical window based on a corrected value of the first voltage.
原文（中文）
An optical window inspection apparatus including: a first light projector that emits first detection light that passes through an optical window transmitting incident light; a second light projector that emits second detection light that does not pass through the optical window; a light receiver that receives the first detection light and the second detection light in which a first voltage corresponding to an intensity of the received first detection light and a second voltage corresponding to an intensity of the received second detection light are generated; and a control unit that corrects a value of the first voltage based on a value of the second voltage and a predetermined reference value and performs processing to detect contamination of the optical window based on a corrected value of the first voltage.