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Evaluation Method and Analyzer Apparatus

发明专利审中
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8权利要求 · 2 独立
§ Ⅰ

卷宗概要

发明人

Konomi Ikita; Kenichi Tsutsumi

IPC 分类

G1N 23/203

CPC 分类

G1N23/203G1N2223/53G1N2223/102G1N2223/323

There is provided an evaluation method of evaluating the density of a sample. The evaluation method starts with acquiring a backscattered electron spectrum from the sample. Then, an elastically scattered peak of the spectrum is separated into a plurality of minor peaks by waveform separation. Information about the positions and widths of the minor peaks is derived. The chemical elements making up the sample are identified from the positions and widths of the minor peaks.

原文(中文)

There is provided an evaluation method of evaluating the density of a sample. The evaluation method starts with acquiring a backscattered electron spectrum from the sample. Then, an elastically scattered peak of the spectrum is separated into a plurality of minor peaks by waveform separation. Information about the positions and widths of the minor peaks is derived. The chemical elements making up the sample are identified from the positions and widths of the minor peaks.