Inertial Measurement Device
卷宗概要
发明人
Yasushi YOSHIKAWA; Kenta SATO
IPC 分类
CPC 分类
An inertial measurement device includes: a substrate; a container configured to house the substrate; a first fixation member and a second fixation member configured to fix the substrate to the container; a first sensor disposed at the substrate and configured to detect a physical quantity along an orthogonal axis to the substrate; and a second sensor disposed at the substrate, wherein the first sensor, the first fixation member and the second fixation member, and the second sensor are arranged in this order in a first direction parallel to the substrate, the second sensor detects a physical quantity along a second axis orthogonal to the first axis, and is separated from the first sensor by an area between the first fixation member and the second fixation member when viewed in a direction along the orthogonal axis.
原文（中文）
An inertial measurement device includes: a substrate; a container configured to house the substrate; a first fixation member and a second fixation member configured to fix the substrate to the container; a first sensor disposed at the substrate and configured to detect a physical quantity along an orthogonal axis to the substrate; and a second sensor disposed at the substrate, wherein the first sensor, the first fixation member and the second fixation member, and the second sensor are arranged in this order in a first direction parallel to the substrate, the second sensor detects a physical quantity along a second axis orthogonal to the first axis, and is separated from the first sensor by an area between the first fixation member and the second fixation member when viewed in a direction along the orthogonal axis.