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TESTER AND TEST CONTROL DEVICE AND METHOD

发明专利审中
5浏览
12权利要求 · 2 独立
§ Ⅰ

卷宗概要

发明人

Ning Ju; Xiaotong Zhang

IPC 分类

G1R 31/28

CPC 分类

G1R31/2834

The disclosure relates to a tester, a test control device and a test control method. The device comprises a parallel control unit and a plurality of station control units, wherein each of the station control units corresponds to at least one device under test. The parallel control unit is connected with the station control units and a host respectively and is configured to receive test items sent by the host and send each of test sequences in the test items to a station control unit corresponding to a device under test corresponding to the test sequence. Each of the station control units is connected with a plurality of function boards respectively, wherein functions realized by the function boards are different. Any station control unit is configured to send received test sequence(s) to corresponding function boards according to functions required to realize for the received test sequence(s).

原文(中文)

The disclosure relates to a tester, a test control device and a test control method. The device comprises a parallel control unit and a plurality of station control units, wherein each of the station control units corresponds to at least one device under test. The parallel control unit is connected with the station control units and a host respectively and is configured to receive test items sent by the host and send each of test sequences in the test items to a station control unit corresponding to a device under test corresponding to the test sequence. Each of the station control units is connected with a plurality of function boards respectively, wherein functions realized by the function boards are different. Any station control unit is configured to send received test sequence(s) to corresponding function boards according to functions required to realize for the received test sequence(s).