TEST INTERCONNECT TEMPERATURE CONTROL WITH GAS FLOW
卷宗概要
发明人
James Ray HASTINGS; Karthik RANGANATHAN; Joe E. KOETH; Ethan Jeffrey CALVARIO CASTILLO
IPC 分类
CPC 分类
Various embodiments include techniques for controlling temperature of a test socket in a test system. A temperature controller determines an input temperature associated with a reference device under test (DUT) mounted in the test socket. The temperature controller determines a flow rate of a gas based on the input temperature. The temperature controller adjusts a flow control valve to supply the gas to the reference DUT at the flow rate.
原文(中文)
Various embodiments include techniques for controlling temperature of a test socket in a test system. A temperature controller determines an input temperature associated with a reference device under test (DUT) mounted in the test socket. The temperature controller determines a flow rate of a gas based on the input temperature. The temperature controller adjusts a flow control valve to supply the gas to the reference DUT at the flow rate.