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TEST INTERCONNECT TEMPERATURE CONTROL WITH GAS FLOW

发明专利审中
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25权利要求 · 2 独立
§ Ⅰ

卷宗概要

发明人

James Ray HASTINGS; Karthik RANGANATHAN; Joe E. KOETH; Ethan Jeffrey CALVARIO CASTILLO

IPC 分类

G1R 31/28G1R 1/4

CPC 分类

G1R31/2877G1R1/458

Various embodiments include techniques for controlling temperature of a test socket in a test system. A temperature controller determines an input temperature associated with a reference device under test (DUT) mounted in the test socket. The temperature controller determines a flow rate of a gas based on the input temperature. The temperature controller adjusts a flow control valve to supply the gas to the reference DUT at the flow rate.

原文(中文)

Various embodiments include techniques for controlling temperature of a test socket in a test system. A temperature controller determines an input temperature associated with a reference device under test (DUT) mounted in the test socket. The temperature controller determines a flow rate of a gas based on the input temperature. The temperature controller adjusts a flow control valve to supply the gas to the reference DUT at the flow rate.