TEST FIXTURE, CALIBRATION SETUP AND METHOD OF CALIBRATING A TEST AND/OR MEASUREMENT INSTRUMENT
卷宗概要
发明人
Benedikt LIPPERT; Martin PESCHKE
IPC 分类
CPC 分类
The present disclosure relates to a test fixture for being connected to a calibration device for calibrating a test and/or measurement instrument. The test fixture includes a probing point configured to receive a calibration signal while being in contact with a probe. The test fixture has a memory configured to store fixture data related to the probing point. Further, a calibration setup and a method of calibrating a test and/or measurement instrument are described.
原文（中文）
The present disclosure relates to a test fixture for being connected to a calibration device for calibrating a test and/or measurement instrument. The test fixture includes a probing point configured to receive a calibration signal while being in contact with a probe. The test fixture has a memory configured to store fixture data related to the probing point. Further, a calibration setup and a method of calibrating a test and/or measurement instrument are described.