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METHOD AND APPARATUS FOR PROCESSING SCINTILLATION PULSES, AND DEVICE AND STORAGE MEDIUM

发明专利审中
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29权利要求 · 8 独立
§ Ⅰ

卷宗概要

发明人

Yun Hu; Lei Fang; Bo Zhang; Lingli Yang; Weicao Chen; Wenlue Huang

IPC 分类

G1T 1/208G1T 1/202G1T 1/29

CPC 分类

G1T1/208G1T1/202G1T1/2985

A method and apparatus for processing scintillation pulses, and a device and a storage medium. The method includes: presetting two trigger thresholds, and respectively performing multi-voltage threshold sampling on at least two scintillation pulses based on the two trigger thresholds, to acquire first sampling data; based on the first sampling data, determining one or more effective scintillation pulses from among at least two scintillation pulses; superimposing the effective scintillation pulses, to acquire a target scintillation pulse; presetting multiple sampling thresholds, and performing multi-voltage threshold sampling on the target scintillation pulse based on multiple sampling thresholds, to acquire second sampling data; based on the second sampling data, determining whether the target scintillation pulse corresponds to a real single event; and if the target scintillation pulse corresponds to a real single event, based on the first sampling data and the second sampling data, determining event information of the real single event.

原文(中文)

A method and apparatus for processing scintillation pulses, and a device and a storage medium. The method includes: presetting two trigger thresholds, and respectively performing multi-voltage threshold sampling on at least two scintillation pulses based on the two trigger thresholds, to acquire first sampling data; based on the first sampling data, determining one or more effective scintillation pulses from among at least two scintillation pulses; superimposing the effective scintillation pulses, to acquire a target scintillation pulse; presetting multiple sampling thresholds, and performing multi-voltage threshold sampling on the target scintillation pulse based on multiple sampling thresholds, to acquire second sampling data; based on the second sampling data, determining whether the target scintillation pulse corresponds to a real single event; and if the target scintillation pulse corresponds to a real single event, based on the first sampling data and the second sampling data, determining event information of the real single event.