CONVEYANCE APPARATUS, LITHOGRAPHY APPARATUS, AND ARTICLE MANUFACTURING METHOD
卷宗概要
发明人
KIMIO TAKEYA
IPC 分类
CPC 分类
The aspect of the embodiments, provides an apparatus comprising: a measurement device configured to measure foreign particles on a surface of an object; a conveyer including a holder configured to hold the object while contacting a part of the surface of the object, and configured to convey the object for which the foreign particles have been measured, while holding the object by the holder; and a controller configured to control conveying the object by the conveyer, in accordance with specific foreign particles in a contact region to which the holder contacts among the surface of the object, wherein the specific foreign particles are obtained from a measurement result of the measurement device.
原文（中文）
The aspect of the embodiments, provides an apparatus comprising: a measurement device configured to measure foreign particles on a surface of an object; a conveyer including a holder configured to hold the object while contacting a part of the surface of the object, and configured to convey the object for which the foreign particles have been measured, while holding the object by the holder; and a controller configured to control conveying the object by the conveyer, in accordance with specific foreign particles in a contact region to which the holder contacts among the surface of the object, wherein the specific foreign particles are obtained from a measurement result of the measurement device.