CNIPA.AI
返回搜索
档案

DSP CIRCUIT, TEST AND/OR MEASUREMENT INSTRUMENT, AND SIGNAL PROCESSING METHOD

发明专利审中
20权利要求 · 2 独立
§ Ⅰ

卷宗概要

发明人

Andrew SCHAEFER; Victor ARROYO

IPC 分类

G6F 1/2G6F 1/3G6F 9/30

CPC 分类

G6F1/22G6F1/3G6F9/3001

A digital signal processing (DSP) circuit is described. The DSP circuit includes a signal input, a signal encoding circuit, a generative circuit, and a DSP function circuit. The signal input is configured to receive at least one input signal. The signal encoding circuit is configured to process the at least one input signal, wherein the signal encoding circuit is configured to map the at least one input signal to at least one signal characterization parameter. The generative circuit is configured to generate a set of measurement data based on the at least one signal characterization parameter, wherein the set of measurement data includes at least one measurement value. The DSP function circuit is configured to provide a DSP functionality. The DSP function circuit is configured to process and/or combine the set of measurement data, thereby obtaining a set of expedited output data.

原文(中文)

A digital signal processing (DSP) circuit is described. The DSP circuit includes a signal input, a signal encoding circuit, a generative circuit, and a DSP function circuit. The signal input is configured to receive at least one input signal. The signal encoding circuit is configured to process the at least one input signal, wherein the signal encoding circuit is configured to map the at least one input signal to at least one signal characterization parameter. The generative circuit is configured to generate a set of measurement data based on the at least one signal characterization parameter, wherein the set of measurement data includes at least one measurement value. The DSP function circuit is configured to provide a DSP functionality. The DSP function circuit is configured to process and/or combine the set of measurement data, thereby obtaining a set of expedited output data.