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METHOD FOR LIFETIME PREDICTION AND MONITORING

发明专利审中
14权利要求 · 3 独立
§ Ⅰ

卷宗概要

发明人

Thomas CHRISTEN; Felipe MACEDO

IPC 分类

G6N 5/22G6N 7/1

CPC 分类

G6N5/22G6N7/1

A method for lifetime prediction and monitoring of a device, and a corresponding system are provided. The method comprises calculating a probability density function over time for an aging variable based on solving equation(s) from an aging model with an End of Life (EOL) boundary condition, wherein the boundary condition includes a first boundary condition and a second boundary condition, wherein the first boundary condition is a no-flux boundary condition and the second boundary condition is an absorbing or partly absorbing boundary condition, measuring an condition related observable of the device; obtaining first data representing measurement of the observable, calculating a likelihood for the aging variable from the first data, updating the calculated probability density function of the aging variable based on the likelihood, and generating a signal indicating a health prediction of the device based on the probability density function, the aging model and the EOL boundary condition.

原文(中文)

A method for lifetime prediction and monitoring of a device, and a corresponding system are provided. The method comprises calculating a probability density function over time for an aging variable based on solving equation(s) from an aging model with an End of Life (EOL) boundary condition, wherein the boundary condition includes a first boundary condition and a second boundary condition, wherein the first boundary condition is a no-flux boundary condition and the second boundary condition is an absorbing or partly absorbing boundary condition, measuring an condition related observable of the device; obtaining first data representing measurement of the observable, calculating a likelihood for the aging variable from the first data, updating the calculated probability density function of the aging variable based on the likelihood, and generating a signal indicating a health prediction of the device based on the probability density function, the aging model and the EOL boundary condition.