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AUTOMATIC CALCULATION METHOD FOR SURFACE DEFECT AREA OF WET BLUE SKIN BASED ON DEEPLABV3+ MODEL

发明专利审中
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5权利要求 · 1 独立
§ Ⅰ

卷宗概要

发明人

Wei LIN; Changping HUANG; Chunhua WANG; Le YANG; Long ZHANG; Jianhui WU

IPC 分类

G6T 7/

CPC 分类

G6T7/2G6T2207/20081G6T2207/20084

Provided is an automatic calculation method for a surface defect area of a wet blue skin based on a Deeplab V3+ model, aiming at solving the problem that the automatic calculation of the defect area is difficult in a tannery. The method includes image data acquisition and preprocessing of a wet blue skin, training and verification of a wet blue skin defect segmentation model based on a Deeplab V3+ model, and automatic calculation of the defect area in a segmented image. The method can accurately segment common defects such as knife holes, brands and the like on the surface of a large-area wet blue skin, with a high speed of detecting a wet blue skin within 1s.

原文(中文)

Provided is an automatic calculation method for a surface defect area of a wet blue skin based on a Deeplab V3+ model, aiming at solving the problem that the automatic calculation of the defect area is difficult in a tannery. The method includes image data acquisition and preprocessing of a wet blue skin, training and verification of a wet blue skin defect segmentation model based on a Deeplab V3+ model, and automatic calculation of the defect area in a segmented image. The method can accurately segment common defects such as knife holes, brands and the like on the surface of a large-area wet blue skin, with a high speed of detecting a wet blue skin within 1s.