Appearance Inspection System and Appearance Inspection Method
卷宗概要
发明人
Sho YAMAGUCHI; Naoki HOSOYA; Yutaka ARAI; Yoshiaki NAGASHIMA; Riku NAKATA
IPC 分类
CPC 分类
An appearance inspection apparatus includes: an annotation unit that associates annotation information indicating whether a defect of a structure is normal with an input image to be used for an appearance inspection of the structure, the information being determined by a user based on the input image; a learning unit that generates a trained model by deep learning using the information and the input image associated with the information with respect to an initially-set trained model; and a defect inference unit that outputs a result obtained by inferring the defect based on the input image using the trained model generated by the learning unit, in which the annotation unit associates the information with the input image for which the result is different from a result of the determination made by the user for the input image to cause the learning unit to relearn the trained model.
原文（中文）
An appearance inspection apparatus includes: an annotation unit that associates annotation information indicating whether a defect of a structure is normal with an input image to be used for an appearance inspection of the structure, the information being determined by a user based on the input image; a learning unit that generates a trained model by deep learning using the information and the input image associated with the information with respect to an initially-set trained model; and a defect inference unit that outputs a result obtained by inferring the defect based on the input image using the trained model generated by the learning unit, in which the annotation unit associates the information with the input image for which the result is different from a result of the determination made by the user for the input image to cause the learning unit to relearn the trained model.