IMAGE INSPECTION APPARATUS, IMAGE FORMING APPARATUS, AND IMAGE INSPECTION METHOD
卷宗概要
申请人
Kota AOYAGI; Takuji KAMADA; Keiji KOJIMA; Wataru NARA; UMEMURA Educational Institutions
发明人
Kota AOYAGI; Kimiya AOKI; Takuji KAMADA; Keiji KOJIMA; Wataru NARA
IPC 分类
CPC 分类
An image inspection apparatus for inspecting a defect of an inspection object is disclosed. The image inspection apparatus includes an imager configured to capture an inspection image of the inspection object; and a processor configured to process the inspection image captured by the imager. The processing the inspection image by the processor includes generating a sensitivity map image which has the same size as the inspection image and a non-defective image and in which a detection threshold is set for each predetermined detection region, and detecting a defect region using the sensitivity map image.
原文（中文）
An image inspection apparatus for inspecting a defect of an inspection object is disclosed. The image inspection apparatus includes an imager configured to capture an inspection image of the inspection object; and a processor configured to process the inspection image captured by the imager. The processing the inspection image by the processor includes generating a sensitivity map image which has the same size as the inspection image and a non-defective image and in which a detection threshold is set for each predetermined detection region, and detecting a defect region using the sensitivity map image.