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METHOD FOR AUTOMATED GRAIN MAPPING

发明专利审中
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19权利要求 · 2 独立
§ Ⅰ

卷宗概要

发明人

Ryan C. Breneman; Kyle Ingram

IPC 分类

G6T 17/G6V 10/141

CPC 分类

G6T17/G6V10/141

A method for grain mapping of a surface of a component includes the steps of constructing a model comprising a three-dimensional scanned model of the component; scanning the component with RGB light to obtain an RGB light scan; applying the RGB light scan to the three-dimensional scanned model of the component to produce a combined three-dimensional model of the component with an RGB light scan overlay on the three-dimensional model; and analyzing the combined three-dimensional model of the component with the RGB light scan overlay on the three-dimensional model to identify grain boundaries in the component.

原文(中文)

A method for grain mapping of a surface of a component includes the steps of constructing a model comprising a three-dimensional scanned model of the component; scanning the component with RGB light to obtain an RGB light scan; applying the RGB light scan to the three-dimensional scanned model of the component to produce a combined three-dimensional model of the component with an RGB light scan overlay on the three-dimensional model; and analyzing the combined three-dimensional model of the component with the RGB light scan overlay on the three-dimensional model to identify grain boundaries in the component.