TRAINING APPARATUS, METHOD, AND IMAGE PROCESSING APPARATUS
卷宗概要
发明人
Gaku Minamoto; Satoshi Ito; Osamu Yamaguchi; Reiko Noda
IPC 分类
CPC 分类
According to one embodiment, a training apparatus includes processing circuitry. The processing circuitry calculates a similarity between a subject image and at least one normal image. The processing circuitry selects at least one reference image from the normal image based on the similarity. The processing circuitry calculates first feature maps of the subject image and second feature maps of the reference image using a first machine learning model. The processing circuitry calculates differential feature maps that are differences between the first and second feature maps. The processing circuitry calculates a likelihood map based on the first feature maps and the differential feature maps using a second machine learning model. The processing circuitry calculates, based on the likelihood map and a teaching label of the subject image, a loss based on a likelihood. The processing circuitry updates the first and second machine learning models based on the loss.
原文(中文)
According to one embodiment, a training apparatus includes processing circuitry. The processing circuitry calculates a similarity between a subject image and at least one normal image. The processing circuitry selects at least one reference image from the normal image based on the similarity. The processing circuitry calculates first feature maps of the subject image and second feature maps of the reference image using a first machine learning model. The processing circuitry calculates differential feature maps that are differences between the first and second feature maps. The processing circuitry calculates a likelihood map based on the first feature maps and the differential feature maps using a second machine learning model. The processing circuitry calculates, based on the likelihood map and a teaching label of the subject image, a loss based on a likelihood. The processing circuitry updates the first and second machine learning models based on the loss.