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PROCESS GAS MONITORING APPARATUS, VOLATILIZATION VESSEL, SUBSTRATE PROCESSING APPARATUS, AND METHOD

发明专利审中
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28权利要求 · 4 独立
§ Ⅰ

卷宗概要

发明人

SunJoo Park; HakJoo Lee; WanGyu Lim; SeungMin Shin; Junli Li

IPC 分类

H1L 21/67

CPC 分类

H1L21/67017

This disclosure relates to a process gas monitoring apparatus, a volatilization vessel, a substrate processing apparatus, and a method for monitoring supply of process gas into a process chamber. The process gas comprises a chemical substance thermally decomposable to form a decomposition product, and the method comprises measuring concentration of the decomposition product in the process gas.

原文(中文)

This disclosure relates to a process gas monitoring apparatus, a volatilization vessel, a substrate processing apparatus, and a method for monitoring supply of process gas into a process chamber. The process gas comprises a chemical substance thermally decomposable to form a decomposition product, and the method comprises measuring concentration of the decomposition product in the process gas.