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CARBON MATERIAL, NEGATIVE ELECTRODE, SECONDARY BATTERY, METHOD FOR MANUFACTURING CARBON MATERIAL, METHOD FOR MANUFACTURING NEGATIVE ELECTRODE, AND METHOD FOR MANUFACTURING SECONDARY BATTERY

发明专利审中
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18权利要求 · 3 独立
§ Ⅰ

卷宗概要

发明人

Ryuuto YUASA; Nobuyuki ISHIWATARI; Masakazu YOKOMIZO

IPC 分类

H1M 4/36H1M 4/2H1M 4/4H1M 4/133H1M 4/583H1M 4/62H1M 10/525

CPC 分类

H1M4/366H1M4/404H1M4/133H1M4/583H1M4/622H1M4/625H1M10/525H1M2004/21H1M2004/27

A carbon material containing graphite particles. The graphite particles are natural graphite coated with an amorphous carbonaceous substance. When the carbon material is included in an electrode fabricated by adding a binder resin and a dispersion medium to the carbon material to form a slurry, applying the slurry to a metal current collector, drying the applied slurry to form an active material layer on the metal current collector, and then pressing the active material layer such that the active material layer has a density of 1.65 g/cm, the carbon material has an orientation parameter intensity ratio I(002)/I(110) of from 200 to 1200, where I(110) is a peak intensity corresponding to a lattice plane (110) and I(002) is a peak intensity corresponding to a lattice plane (002), and both I(110) and I(002) are obtained by a wide-angle X-ray diffraction measurement.

原文(中文)

A carbon material containing graphite particles. The graphite particles are natural graphite coated with an amorphous carbonaceous substance. When the carbon material is included in an electrode fabricated by adding a binder resin and a dispersion medium to the carbon material to form a slurry, applying the slurry to a metal current collector, drying the applied slurry to form an active material layer on the metal current collector, and then pressing the active material layer such that the active material layer has a density of 1.65 g/cm, the carbon material has an orientation parameter intensity ratio I(002)/I(110) of from 200 to 1200, where I(110) is a peak intensity corresponding to a lattice plane (110) and I(002) is a peak intensity corresponding to a lattice plane (002), and both I(110) and I(002) are obtained by a wide-angle X-ray diffraction measurement.