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Measurement Method and Apparatus, and Device

发明专利审中
12浏览
20权利要求 · 3 独立
§ Ⅰ

卷宗概要

发明人

Wenjuan Pu; Xiaodong Yang

IPC 分类

H4W 24/10H4B 7/6H4B 17/318

CPC 分类

H4W24/10H4B7/6952H4B17/318

A measurement method includes performing, by a terminal, a first operation in a case that a first condition is met. The first operation includes at least one of starting first measurement, reporting a measurement result according to a first measurement result reporting configuration, or starting a conditional reconfiguration procedure, and the first condition is related to a height and/or a beam of the terminal.

原文(中文)

A measurement method includes performing, by a terminal, a first operation in a case that a first condition is met. The first operation includes at least one of starting first measurement, reporting a measurement result according to a first measurement result reporting configuration, or starting a conditional reconfiguration procedure, and the first condition is related to a height and/or a beam of the terminal.