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SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD

发明专利审中
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14权利要求 · 4 独立
§ Ⅰ

卷宗概要

发明人

Gianpaolo ROMANO; Giovanni ALFIERI; Andrei MIHAILA; Yulieth Cristina ARANGO

IPC 分类

H10D 62/13H10D 12/H10D 30/66H10D 62/832

CPC 分类

H10D62/153H10D12/441H10D30/66H10D12/481H10D30/668H10D62/8325

In one embodiment, the semiconductor device () comprises a semiconductor body (), a gate electrode () and a first electrode (), wherein—the semiconductor body () comprises a first region () which is a source region or an emitter region, and comprises a well region () located next to the first region (), the first region () is of a first conductivity type and the well region () is of a second conductivity type, —the well region () is separated from the gate electrode () by a gate insulator layer (), —the first region () is electrically contacted by means of the first electrode (), —in the first region () there is at least one current limiting region (), and—the at least one current limiting region () is a sub-region of the first region () with a decreased electrical conductivity.

原文(中文)

In one embodiment, the semiconductor device () comprises a semiconductor body (), a gate electrode () and a first electrode (), wherein—the semiconductor body () comprises a first region () which is a source region or an emitter region, and comprises a well region () located next to the first region (), the first region () is of a first conductivity type and the well region () is of a second conductivity type, —the well region () is separated from the gate electrode () by a gate insulator layer (), —the first region () is electrically contacted by means of the first electrode (), —in the first region () there is at least one current limiting region (), and—the at least one current limiting region () is a sub-region of the first region () with a decreased electrical conductivity.