Probe and detection device

The embodiment of the invention provides a probe and a detection device. The probe comprises a conductive substrate, a supporting structure and a conductive layer, the conductive substrate is used for being electrically connected with a test signal line, the supporting structure is arranged on one side of the conductive substrate, the supporting structure is elastic, the conductive layer wraps the outer surface of the supporting structure and is electrically connected with the conductive substrate, and the conductive layer is used for abutting against a bonding pad to be tested. According to the embodiment of the invention, the problem that the to-be-tested substrate is damaged due to too hard probes can be solved, and the yield of the to-be-tested substrate is improved.