Industrial defect detection method and related equipment
数据来源:EPO OPS
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卷宗概要
申请号
CN202310181576
发明人
HA QIAN
申请日
Feb 20, 2023
公开日
Aug 20, 2024
专利族 ID
92278400
IPC 分类
CPC 分类
The invention provides an industrial defect detection method and related equipment. Specifically, the detection method comprises the following steps: acquiring image information of a to-be-detected object; determining a to-be-detected pixel point and a corresponding standard line according to the image information; calculating the distance between the pixel point to be detected and the standard line; and according to a preset defect judgment rule and the distance, determining whether the to-be-detected object has a defect and a corresponding defect position. Therefore, automatic judgment and positioning of defects are realized, and the technical effects of efficient detection and cost saving are achieved.
EPO 研究资料
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