原始名称记载: Kota AOYAGI; Takuji KAMADA; Keiji KOJIMA; Wataru NARA; UMEMURA Educational Institutions

An image inspection apparatus for inspecting a defect of an inspection object is disclosed. The image inspection apparatus includes an imager configured to capture an inspection image of the inspection object; and a processor configured to process the inspection image captured by the imager. The processing the inspection image by the processor includes generating a sensitivity map image which has the same size as the inspection image and a non-defective image and in which a detection threshold is set for each predetermined detection region, and detecting a defect region using the sensitivity map image.