元の名称記録: Aeva, Inc.

A method includes identifying, by a processing device, a first frequency in a frequency domain waveform that exceeds a threshold value for a first likelihood metric. The method includes selecting, by the processing device, a peak frequency from the frequency domain waveform corresponding to a frequency with a highest value for a second likelihood metric based on the first frequency. The method includes determining a property of a target based at least in part on the selected peak frequency.