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案件記録

METHOD OF TREATING A SHUTTER OF A PVD APPARATUS

発明審査中
6閲覧数
17請求項 · 2 独立
§ Ⅰ

案件概要

発明者

Scott HAYMORE; Tony WILBY; Stephen JONES

IPC分類

C23C 14/34C23C 14/14H1L 21/3213

CPC分類

C23C14/34C23C14/14H1L21/32136

Method of treating a shutter of a PVD apparatus including providing a PVD apparatus comprising a chamber, a target, a substrate support positioned in the chamber and a shutter which is deployable within the chamber to divide the chamber into a first compartment in which the substrate support is positioned, and a second compartment in which the target is positioned, providing a substrate having a pasting material deposited thereon, the substrate being positioned on the substrate support, deploying the shutter within the chamber to divide the chamber into the first and second compartments. The shutter may have an underside which, in its deployed position, faces the substrate. At least one contaminant material may be present on the underside and generating a plasma in the first compartment to sputter etch pasting material onto the underside of the shutter, thereby pasting the contaminant material to the underside of the shutter.

原文(中国語)

Method of treating a shutter of a PVD apparatus including providing a PVD apparatus comprising a chamber, a target, a substrate support positioned in the chamber and a shutter which is deployable within the chamber to divide the chamber into a first compartment in which the substrate support is positioned, and a second compartment in which the target is positioned, providing a substrate having a pasting material deposited thereon, the substrate being positioned on the substrate support, deploying the shutter within the chamber to divide the chamber into the first and second compartments. The shutter may have an underside which, in its deployed position, faces the substrate. At least one contaminant material may be present on the underside and generating a plasma in the first compartment to sputter etch pasting material onto the underside of the shutter, thereby pasting the contaminant material to the underside of the shutter.

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