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案件記録

Method and Control Unit For Monitoring The Temperature Of An Electronic Device

発明審査中
16請求項 · 1 独立
§ Ⅰ

案件概要

発明者

Markus Stutika; Jorge Felix Silva Gracia; Fabian Klein; Alex Schmidt

IPC分類

G1K 15/G1K 7/42

CPC分類

G1K15/5G1K7/427

A method for monitoring the temperature of an electronic device is provided. The method includes specifying a position for temperature monitoring in a region of the electronic device and determining a parameter value of a parameter that is associated with an actual temperature at the position. The method also includes calculating a temperature at the position based on the parameter value using a calibrated model, where the calibrated model is implemented in a control unit and calibrated in such a way that the sum of the actual temperature at the position and a specified tolerance threshold is less than or equal to the calculated temperature. A corresponding control unit is also provided.

原文(中国語)

A method for monitoring the temperature of an electronic device is provided. The method includes specifying a position for temperature monitoring in a region of the electronic device and determining a parameter value of a parameter that is associated with an actual temperature at the position. The method also includes calculating a temperature at the position based on the parameter value using a calibrated model, where the calibrated model is implemented in a control unit and calibrated in such a way that the sum of the actual temperature at the position and a specified tolerance threshold is less than or equal to the calculated temperature. A corresponding control unit is also provided.

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