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案件記録

SYSTEM FOR WINDSHIELD RESIDUE DETECTION AND QUANTIFICATION

発明審査中
1閲覧数
20請求項 · 2 独立
§ Ⅰ

案件概要

発明者

Jiasen ZHENG; Karthik PADUCHURU SUBRAMANYAM; Brian HETTIARACHCHI; Lily MA

IPC分類

G1N 21/88G1N 21/958

CPC分類

G1N21/8851G1N21/8806G1N21/958G1N2021/8848G1N2021/889G1N2021/9586

Some embodiments of the present disclosure relate to systems and methods for detecting and quantifying residues on a surface, such as a windshield, for a vehicle. In some embodiments, a system may include a light source assembly, a camera assembly, and a computing device. The light source assembly can direct a polarized light toward the surface. The camera assembly can capture the polarized light reflected from the surface to generate an image. The computing device can process the image to generate a processing result indicative of cleanliness of the surface.

原文(中国語)

Some embodiments of the present disclosure relate to systems and methods for detecting and quantifying residues on a surface, such as a windshield, for a vehicle. In some embodiments, a system may include a light source assembly, a camera assembly, and a computing device. The light source assembly can direct a polarized light toward the surface. The camera assembly can capture the polarized light reflected from the surface to generate an image. The computing device can process the image to generate a processing result indicative of cleanliness of the surface.

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