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案件記録

TEST INTERCONNECT TEMPERATURE CONTROL WITH GAS FLOW

発明審査中
1閲覧数
25請求項 · 2 独立
§ Ⅰ

案件概要

発明者

James Ray HASTINGS; Karthik RANGANATHAN; Joe E. KOETH; Ethan Jeffrey CALVARIO CASTILLO

IPC分類

G1R 31/28G1R 1/4

CPC分類

G1R31/2877G1R1/458

Various embodiments include techniques for controlling temperature of a test socket in a test system. A temperature controller determines an input temperature associated with a reference device under test (DUT) mounted in the test socket. The temperature controller determines a flow rate of a gas based on the input temperature. The temperature controller adjusts a flow control valve to supply the gas to the reference DUT at the flow rate.

原文(中国語)

Various embodiments include techniques for controlling temperature of a test socket in a test system. A temperature controller determines an input temperature associated with a reference device under test (DUT) mounted in the test socket. The temperature controller determines a flow rate of a gas based on the input temperature. The temperature controller adjusts a flow control valve to supply the gas to the reference DUT at the flow rate.

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