TEST APPARATUS AND TEST COVER THEREOF
案件概要
出願人
SILICONWARE PRECISION INDUSTRIES CO., LTD.
発明者
Wu-Su CHEN; Shih-Sheng LUO; Hui-Lung CHEN; Tz-Chi YU
IPC分類
CPC分類
A test apparatus and a test cover thereof are provided for electrical testing of a relay on a carrier board. The test cover includes a sleeve and a plurality of contacts. The sleeve is used to sleeve-couple to the relay. The plurality of contacts are disposed at an end of the sleeve and protrude from the sleeve and are used to contact and be electrically connected to a plurality of pins of the relay when the sleeve is sleeve-coupled to the relay for electrical testing. The test apparatus is capable of performing directly electrical test on the relay on the carrier board without the need for desoldering or dismantling the relay prior to performing electrical test. Therefore, the time required for addressing abnormal events during electronic component testing can be reduced, and the hazards associated with desoldering or dismantling the carrier board can be prevented.
原文(中国語)
A test apparatus and a test cover thereof are provided for electrical testing of a relay on a carrier board. The test cover includes a sleeve and a plurality of contacts. The sleeve is used to sleeve-couple to the relay. The plurality of contacts are disposed at an end of the sleeve and protrude from the sleeve and are used to contact and be electrically connected to a plurality of pins of the relay when the sleeve is sleeve-coupled to the relay for electrical testing. The test apparatus is capable of performing directly electrical test on the relay on the carrier board without the need for desoldering or dismantling the relay prior to performing electrical test. Therefore, the time required for addressing abnormal events during electronic component testing can be reduced, and the hazards associated with desoldering or dismantling the carrier board can be prevented.
外部リソース