METHOD AND SYSTEM FOR DETECTING DEFECTIVE CELLS
案件概要
発明者
Minsoo KIM; Bokhyun KA; Moon-Seok KWON
IPC分類
CPC分類
The present disclosure provides a method for detecting a defective cell. The method may include: charging a cell in a manner that the state of charge (SOC) of the cell falls within a reference range, obtaining first charge data including differential voltage information of a negative electrode of the cell while the cell is being charged, where the negative electrode includes graphite and silicon, calculating a charging parameter associated with the silicon of the negative electrode based on the first charge data, and determining whether the cell is defective based on the charging parameter associated with the silicon.
原文（中国語）
The present disclosure provides a method for detecting a defective cell. The method may include: charging a cell in a manner that the state of charge (SOC) of the cell falls within a reference range, obtaining first charge data including differential voltage information of a negative electrode of the cell while the cell is being charged, where the negative electrode includes graphite and silicon, calculating a charging parameter associated with the silicon of the negative electrode based on the first charge data, and determining whether the cell is defective based on the charging parameter associated with the silicon.
外部リソース