検索に戻る
案件記録

SCINTILLATOR ARRAY, X-RAY DETECTOR, AND X-RAY INSPECTION DEVICE

発明審査中
2閲覧数
19請求項 · 3 独立
§ Ⅰ

案件概要

発明者

Makoto Hayashi; Eiji Oyaizu; Yoshitaka Adachi; Takashi Rokutanda; Hiroaki Takano

IPC分類

G1T 1/20

CPC分類

G1T1/2002

A decrease and variations in dimensional accuracy due to deformation is suppressed. The scintillator array according to an embodiment includes a plurality of scintillator segments each including a sintered body of a rare earth oxysulfide phosphor, a first reflective layer interposed between adjacent scintillator segments so as to integrate the scintillator segments, and a second reflective layer located on a surface side of the scintillator segments on which X-rays are incident. The amount of deformation of the corners of the second reflective layer is 20 μm or smaller.

原文(中国語)

A decrease and variations in dimensional accuracy due to deformation is suppressed. The scintillator array according to an embodiment includes a plurality of scintillator segments each including a sintered body of a rare earth oxysulfide phosphor, a first reflective layer interposed between adjacent scintillator segments so as to integrate the scintillator segments, and a second reflective layer located on a surface side of the scintillator segments on which X-rays are incident. The amount of deformation of the corners of the second reflective layer is 20 μm or smaller.

外部リソース