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案件記録

ONIUM SALT, CHEMICALLY AMPLIFIED RESIST COMPOSITION, AND PATTERN FORMING PROCESS

発明審査中
7閲覧数
18請求項 · 1 独立
§ Ⅰ

案件概要

IPC分類

G3F 7/4C7C 381/12G3F 7/G3F 7/39

CPC分類

G3F7/45C7C381/12G3F7/46G3F7/397G3F7/70033

The onium salt has the formula (1). The chemically amplified resist composition comprising the onium salt has a high solvent solubility and a high sensitivity and being improved in lithography properties such as LWR, CDU, MEF, EL, and DOF with high contrast when processed by photolithography using high-energy radiation such as KrF or ArF excimer laser, EB, or EUV.

原文(中国語)

The onium salt has the formula (1). The chemically amplified resist composition comprising the onium salt has a high solvent solubility and a high sensitivity and being improved in lithography properties such as LWR, CDU, MEF, EL, and DOF with high contrast when processed by photolithography using high-energy radiation such as KrF or ArF excimer laser, EB, or EUV.

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