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案件記録

CONVEYANCE APPARATUS, LITHOGRAPHY APPARATUS, AND ARTICLE MANUFACTURING METHOD

発明審査中
10閲覧数
20請求項 · 1 独立
§ Ⅰ

案件概要

IPC分類

G3F 7/

CPC分類

G3F7/70725G3F7/7085G3F7/70991

The aspect of the embodiments, provides an apparatus comprising: a measurement device configured to measure foreign particles on a surface of an object; a conveyer including a holder configured to hold the object while contacting a part of the surface of the object, and configured to convey the object for which the foreign particles have been measured, while holding the object by the holder; and a controller configured to control conveying the object by the conveyer, in accordance with specific foreign particles in a contact region to which the holder contacts among the surface of the object, wherein the specific foreign particles are obtained from a measurement result of the measurement device.

原文(中国語)

The aspect of the embodiments, provides an apparatus comprising: a measurement device configured to measure foreign particles on a surface of an object; a conveyer including a holder configured to hold the object while contacting a part of the surface of the object, and configured to convey the object for which the foreign particles have been measured, while holding the object by the holder; and a controller configured to control conveying the object by the conveyer, in accordance with specific foreign particles in a contact region to which the holder contacts among the surface of the object, wherein the specific foreign particles are obtained from a measurement result of the measurement device.

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